Physical Science International Journal

Angular and Thermal Dependence of Defect Modes in Si-Based One-dimensional Photonic Crystal

Kamal Deep Jindal

Department of Physics, Venkteshwara University, Gajraula (J.P. Nagar), India

Arun Kumar

AITTM, Amity University, NOIDA, India

Vipin Kumar *

Department of Physics, Digamber Jain (P.G.) College, Baraut 250611, India

Bhuvneshwer Suthar

Department of Physics, Govt. College of Engineering & Technology, Bikaner 334004, India

Khundrakpam Saratchandra Singh

Department of Physics, Digamber Jain (P.G.) College, Baraut 250611, India

*Author to whom correspondence should be addressed.

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Abstract

The effect of temperature and angle of incidence on defect modes in one-dimensional photonic crystal structure for TE and TM polarizations has been studied in 5-9µm wavelength region. A symmetric Si/air multilayer system, [(Si/air)⁵Si(air/Si)⁵] has been considered in this communication. The refractive index of Si layer is taken to be dependent on temperature and wavelength simultaneously. As the refractive index of Si layer is a function of temperature of medium as well as the wavelength of incident light, this results to the tuning of defect modes. As defect modes are function of temperature, one can tune the defect modes to desired wavelength. The defects modes can also be tuned by angle of incidence for both polarizations. This type of tunable filter may be used as thermal sensing optical device etc.

 

Keywords: photonic bandgap materials, multilayers, defects, optical properties

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