XRD and SEM of Bi4-xLaxTi3O12 Ceramics
Issue: 2016 - Volume 9 [Issue 3]
Satishkumar S. Lature
Department of Physics, PDA College of Engineering, Gulbarga-585 102 (Karnataka), India
Ghanshyam H. Jadhav *
Department of Physics, Shri Chhatrapati Shivaji College, Omerga-413606 (Maharastra), India
*Author to whom correspondence should be addressed.
La-doped bismuth titanate ceramics with composition formula Bi4-xLaxTi3O12 (0 ≤ x ≤ 1.5) was synthesized by solid-state reaction route. These ferroelectric materials find great applications in nonvolatile memories. The x-ray diffraction was carried out to analyze the structures of synthesized ceramics. The x-ray diffraction data revealed that there was a structural phase transformation from pseudo-orthorhombic to tetragonal, for x = 0.75, which was confirmed from (h 0 0), (h k 0) and (h 0 l) planes. SEM images were taken at a magnification of x1000. The Archimedes principle was used to calculate the density of sintered ceramic samples, which was in the range of 81-94% of theoretical value.
Keywords: Bi-layered perovskite material, La-doped bismuth titanate, ceramic technique, phase transition